Editorial Board

Editor-in-Chief
Ryan Sills, PhD, Rutgers University, USA

Associate Editors
Nele Moelans, PhD, University of Leuven (KU Leuven), Belgium
Stefanos Papanikolaou, PhD, National Centre of Nuclear Research, Otwock, Poland and Massachussetts Institute of Technology, Cambridge, MA, USA
Patrizia Trovalusci, PhD, Sapienza University of Rome, Italy
Aurélien Vattré, PhD, ONERA, Université Paris-Saclay, France

Editorial Board
Karim Ahmed, Texas A&M University, USA
Scott Beckman, Washington State University, USA
Yinan Cui, Tsinghua University, China
Anter El-Azab, Purdue University, USA
Haidong Fan, Sichuan University, China
P. J. Guruprasad, Indian Institute of Technology Bombay, India
Thomas Hochrainer, Technische Universität Graz, Austria
Lasse Laurson, Tampere University, Finland
Dan Mordehai, Technion – Israel Institute of Technology, Israel
Joakim Odqvist, PhD, KTH Royal Institute of Technology, Sweden
Shigenobu Ogata, Osaka University, Japan
Giacomo Po, University of Miami, USA
Katrin Schulz, Karlsruhe University of Applied Sciences, Germany
Michael Zaiser, Friedrich-Alexander University of Erlangen-Nürnberg, Germany
Yanguang Zhou, The Hong Kong University of Science and Technology, Hong Kong SAR