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Fig. 9 | Materials Theory

Fig. 9

From: Sweep-tracing algorithm: in silico slip crystallography and tension-compression asymmetry in BCC metals

Fig. 9

Effect of the choice of STA parameters Δt and N on the accuracy of STA method when applied to a DDD simulation trajectory. a “Exact” stress-strain response from the DDD simulation (dashed red line) compared to stress-strain responses reconstructed from the STA facets obtained using various parameter values for Δt and N (see the legend). b Average deviation from the “exact” DDD plastic strain of plastic strain reconstructed from the STA facets extracted using different STA parameter values

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