Fig. 2
From: Stability and symmetry of ion-induced surface patterning
Dependence of the ripple wavelength on temperature for various incident ion flux J values, from 1019 to 1023 m −2 s −1. D 0=2.4025×10−7 m −2, γ=2.9 [J]/[m] 2, Ω=1.5825×10−29 m 3, ρ s =7.0811×1018 m −2, ε=300 eV, normal ion incidence. The scale of the resulting wavelength is shown to be greatly affected by the ion flux J and the temperature